G-Link-200: HALT Testing

  • By Collin
  • /
  • Published Thu, 03/30/2017 - 16:31

Part of the rigorous field testing to which we recently subjected our new G-Link-200 wireless accelerometer node (before its release last month) was the Highly Accelerated Life Test (HALT)—stress testing performed over the operating range of the device to industry specifications.

Among the components of the test was rapid thermal cycling from -40 °C to +85 °C with a simultaneous vibration ramp to 40 g RMS. Harsh environment indeed!

We are proud to report that the G-Link-200 passed the testing with no signal interruption. And to prove it, we’re giving you a behind-the-scenes look at the HALT, below.

Though this testing was performed on our off-the-shelf G-Link-200, we can also perform identical testing for custom profiles, too, made to simulate the environment of your particular application. Our Sales and Support team are happy to help set it up, so contact them, and we’ll get the ball rolling.

For more information on the G-Link-200, click here.